桔柚直播平台官方app下载_桔柚直播免费版app下载_桔柚直播最新下载安装

Non-destructive measure the thin metal film thickness and multi-point measure the whole wafer. 4inch to 8 inch wafer all can measure. High precision can measure ultra thin film even only angstroms. This tool can measure the heavy metal element which heavier than N.