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Parameteric Tester - Equipment - Equipment
Equipment

Parameteric Tester

Date:01-29-2015    Hits:8809

磁存儲(chǔ)芯片參數(shù)測試儀

This tester include EG6000 prober and Agilent 4082 measurement unit, it's has fully automated prober can provide full wafer-level resistance and voltage measurements, and capable of provide a magnetic sensor wafer-level dynamic range test (Rmax to Rmin)